| 薄膜膜系计算的计算机程序设计 |
| Computer Program Design of Calibrating Film System of Thin Film |
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| 中文摘要: |
| 根据膜堆的特征矩阵，求出单层膜的光学导纳，在单层膜的基础上，进行层层递推，叠加起来，求出膜块的等交内，计算振幅反射系数，最后求出整个膜系的反射率、透射率。 |
| 英文摘要: |
| The optical admittance of a single-layer film is derived from the characteristic matrix ofthe film pile. Based on the single- layer,recurring layer by layer,supercomposing one by one,deriving theequivalent admittance of the film pile and calculating the reflect coefficient of the amplitude, thereflectivity and transmissivity of hte whole film system is derived at last. |
| 马前 |
| 长城计量测试技术研究所!北京市，100095 |
| 中文关键词: 膜堆特征矩阵 光学导纳 计算机程序 薄膜 膜系 |
| 英文关键词:Characteristic matrix of film pile, Reflect coeffient of the amplitude, Optical admittance, Reflectivity,Transmissivity, |
| 基金项目: |
| DOI： |
| 引用本文：马前.薄膜膜系计算的计算机程序设计[J].计测技术,1999,(1):23~24,45. |
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