| KWD—502型可控硅稳压电源故障分析与测试 |
| Malfunction Analysis and Test of Type KWD-502 Silicon Controlled DC Voltage-stabilized Source |
| 修订日期：1998-02-23 |
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| 中文摘要: |
| 结合电路工作原理，重点介绍了ＫＷＤ－５０２型可挂硅直流稳压电源四种故障类型的分析处理及其测试方法，以便确保它在测量过程中的使用可靠性。 |
| 英文摘要: |
| Associating the circuit operation principle,the methods of an analysis and test of thefour malfunction patterns of type KWD- 502 silicon controlled DC voltage-stabilized source are mainlyintroduced in order to truly ensure its serviceability during measuring process. |
| 肖润陆 |
| ：肖润陆 |
| 中文关键词: 故障分析 测试 可靠性 可控硅 稳压电源 |
| 英文关键词:Malfunction analysis, Test, Reliability |
| 基金项目: |
| DOI： |
| 引用本文：肖润陆.KWD—502型可控硅稳压电源故障分析与测试[J].计测技术,1999,(3):20~25. |
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