| 基于光频梳的乙炔稳频1542 nm激光波长测量研究 |
| Wavelength measurement of acetylene⁃stabilized laser at 1542 nm using optical frequency combs |
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| 中文摘要: |
| 利用光频梳对稳频激光波长进行测量是建立基于光频梳的波长基标准的必经程序。为了建立基于光频梳的波长标准，并为开展激光波长校准工作提供技术准备，利用自研光纤光频梳对乙炔稳频1542 nm激光波长进行了测量。利用光频梳产生参考激光与待测激光差拍，通过简单的代数关系获得了乙炔稳频激光的绝对频率和真空波长，并与相应的国际推荐值进行了对比。实测获得的乙炔稳频激光的真空波长值为1542.38 371 235 742 nm，在CIPM给定的不确定度范围内，秒稳定度为4.13 × 10-13。两台不同的光频梳对乙炔稳频激光波长的测量结果具有高度一致性，进一步证明了光频梳对激光波长的测量准确性。本研究对于顺应国际长度基标准发展趋势，加速光频梳在激光波长测量领域的应用进程具有重要意义。 |
| 英文摘要: |
| Wavelength measurement of frequency?stabilized lasers using optical frequency combs (OFC) is a necessary procedure to establish OFC?based wavelength standards. In order to establish the wavelength standard based on OFC and provide technical preparations for laser wavelength calibration, the wavelength of an acetylene?stabilized laser at 1542 nm was measured using a self?developed fiber OFC. By means of frequency beating between the reference laser generated by the OFC and the laser to be measured, the absolute frequency and vacuum wavelength of the acetylene?stabilized laser were obtained through simple algebraic relationship and were compared with the corresponding internationally recommended values. The measured vacuum wavelength of the acetylene?stabilized laser was 1542.38371235742 nm, within the uncertainty range given by CIPM. The stability was measured to be 4.13×10-13 in 1 s. The wavelength measurement results of the acetylene?stabilized laser by two different OFCs were highly consistent, which further proved the accuracy of OFC?based wavelength measurement. This research is of great significance for conforming to the international development trend of length standards, and will accelerate the application of OFCs in the field of laser wavelength measurement. |
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| 中文关键词: 计量学 真空波长测量 拍频 稳频激光 光学频率梳 |
| 英文关键词:metrology vacuum wavelength measurement frequency beating frequency stabilized laser optical frequency comb |
| 基金项目: |
| DOI：10.11823/j.issn.1674-5795.2022.04.12 |
| 引用本文：夏传青, 武腾飞, 曹士英, 赵春播, 邢帅.基于光频梳的乙炔稳频1542 nm激光波长测量研究[J].计测技术,2022,(4):. |
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